Application: for the detection of solar cell components, cracked fragments, weld, off grid and different conversion efficiency of single cell abnormal phenomenon.

Product features: the use of imported infrared camera, to ensure the overall quality of the equipment;

Closed light path design can ensure long-term stable operation of the equipment, better adapt to different use environment;

Full English display interface, can automatically manually scan the graphics code number and file saved by coding;

Can enlarge the scanning image display details, easy to judge

The application field of EL flaw detector:

1, battery material defects (debris, hidden cracks, broken gate, pollution);

2, welding defects (weld, welding); 3, different levels of cell compatibility

Product features of EL defect detector:

1 high sensitivity infrared camera can detect defects in the components of the battery chip, can help users to understand the solar cells and components of the material defects and process defects.

2 the device can be applied to the assembly before laminating and laminating process, to achieve defect detection, is an important and effective product technology monitoring and testing equipment.

3 the device is composed of a set of special optical image system and a high sensitivity camera module, which provides a product quality inspection in the process of the component preparation.

Effective test area 1200 * 2100mm

Resolution of 6 million 100 thousand pixels or 11 million 400 thousand pixels

Sensitivity can be detected crack width of less than 0.2 mu m

Test time 60s - 1s free settings

Test mode non contact automatic

Power parameters of single phase 10A 80V maximum load voltage 220V, maximum load current 10A

Configuration test machine (including infrared imager), computer, professional software